Author : Ronald E.Walpole, Raymond H.Myers, Sharon L. Myers, Keying E. Ye
Hardcover: 816 pages
Publisher: Pearson; 9 edition (January 6, 2011)
Language: English
ISBN-10: 0321629116
ISBN-13: 978-0321629111
Product Dimensions: 7.6 x 1.4 x 9.1 inches
This classic text provides a rigorous introduction to basic probability
theory and statistical inference, with a unique balance of theory and
methodology. Interesting, relevant applications use real data from
actual studies, showing how the concepts and methods can be used to
solve problems in the field. This revision focuses on improved clarity
and deeper understanding.
About the Author
Raymond H Myers is currently Professor Emeritus of statistics at
Virginia Tech. He received his Masters and Ph.D. from Virginia Tech in
statistics and his BS in chemical engineering. His major areas of
interest are linear models, design of experiments, and response surface
methodology. He has authored or co-authored six statistics texts that
were published in fifteen separate editions and in several foreign
languages. He has received numerous teaching awards and in 1985 he was
selected "Professor of the Year" in the state of Virginia by the
Council on the Advancement and Support of Education. He was elected
Fellow of ASA in 1974. In 1999 he was given the Shewhart Award for
lifetime contributions in statistics and quality control by the American
Society of Quality. Sharon L Myers is currently Professor
Emeritus of mathematics and statistics at Radford University. She
received her MS in statistics from Virginia Tech. Her areas of interest
are statistical computing, regression analysis, and response surface
methodology. She has co-authored three editions of "Probability &
Statistics for Engineers & Scientists". She was the assistant
director of the statistical consulting center at Virginia Tech for 15
years and the director of the statistical consulting center at Radford
University for 7 years. Keying Ye, University of Texas at San
Antoni.
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